BladeCam2-XHR Description：

Product Manual Datasheet Drawing

Updated with USB 3.0 connectivity and other improvements, the BladeCam2 offers an enhanced BladeCam beam profiling experience. With ultra-small 3.2 μm pixels providing support for beams as small as 32 μm, the high resolution and highly compact BladeCam2-HR beam profiler has a thickness of only 0.5 in. (12.8 mm) for effortless incorporation into tight optical trains and OEM applications.

Key Features

355 to 1150 nm, standard CMOS detector

UV and 1310 nm options available

3.2 μm pixels, 3.1 MPixel, 2048 x 1536

6 fps @ 2048 x 1526, 16 fps @ 1024 x 1024, 35 fps @ 512 x 512

Port-powered USB 3.0

HyperCal? – Dynamic Noise and Baseline Correction software

C-mount filters included

1,000:1 Signal to RMS Noise

Profiles CW/Quasi-CW beams

Electronic auto-shutter, 40 μs to 500 ms

10-bit ADC

Parallel capture on multiple cameras

Field-replaceable image sensors

Relative power level display

Window-free sensors standard for no fringing

ISO 11146 M2 option – beam propagation analysis, divergence, focus

Example Applications

Tight optical trains

CW/Quasi-CW laser profiling

Field servicing of lasers and laser-based systems

Optical assembly & instrument alignment

Beam wander & logging

M2 measurement with available M2DU stage

Specification

Chart